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Reliability-centric high-level synthesis

  • S. Tosun
  • , N. Mansouri
  • , E. Arvas
  • , M. Kandemir
  • , Yuan Xie
  • Syracuse University
  • Pennsylvania State University

Araştırma çıktısı: Kitap/Rapor/Konferans Bildirisinde BölümKonferans katkısıHakemli

62 Alıntılar (Scopus)

Özet

Importance of addressing soft errors in both safety critical applications and commercial consumer products is increasing, mainly due to ever shrinking geometries, higher-density circuits, and employment of power-saving techniques such as voltage scaling and component shut-down. As a result, it is becoming necessary to treat reliability as a first-class citizen in system design. In particular, reliability decisions taken early in system design can have significant benefits in terms of design quality. Motivated by this observation, this paper presents a reliability-centric high-level synthesis approach that addresses the soft error problem. The proposed approach tries to maximize reliability of the design while observing the bounds on area and performance, and makes use of our reliability characterization of hardware components such as adders and multipliers. We implemented the proposed approach, performed experiments with several designs, and compared the results with those obtained by a prior proposal.

Orijinal dilİngilizce
Ana bilgisayar yayını başlığıProceedings - Design, Automation and Test in Europe, DATE 2005
YayınlayanInstitute of Electrical and Electronics Engineers Inc.
Sayfalar1258-1263
Sayfa sayısı6
ISBN (Basılı)0769522882, 9780769522883
DOI'lar
Yayın durumuYayınlandı - 2005
Harici olarak yayınlandıEvet
Etkinlik2005 Design, Automation and Test in Europe, DATE 2005 - Munich, !!Germany
Süre: 7 Mar 200511 Mar 2005

Yayın serisi

AdıProceedings -Design, Automation and Test in Europe, DATE '05
HacimII
ISSN (Basılı)1530-1591

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???event.eventtypes.event.conference???2005 Design, Automation and Test in Europe, DATE 2005
Ülke/Bölge!!Germany
ŞehirMunich
Periyot7/03/0511/03/05

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