TY - GEN
T1 - Reliability-centric hardware/software co-design
AU - Tosun, S.
AU - Mansouri, N.
AU - Arvas, E.
AU - Kandemir, M.
AU - Xie, Y.
AU - Hung, W. L.
PY - 2005
Y1 - 2005
N2 - This paper proposes a reliability-centric hardware/software co-design framework. This framework operates with a component library that provides multiple alternates for a given task, each of which is potentially different from the others in terms of reliability, performance, and area metrics. The paper also presents an experimental evaluation of the proposed co-design framework using several example designs and a comparison to a conventional co-design method that does not consider reliability. Our experimental evaluation demonstrates that the proposed framework can be used to study the tradeoffs between area, performance, and reliability and that it is important to include reliability as a first class parameter in optimization.
AB - This paper proposes a reliability-centric hardware/software co-design framework. This framework operates with a component library that provides multiple alternates for a given task, each of which is potentially different from the others in terms of reliability, performance, and area metrics. The paper also presents an experimental evaluation of the proposed co-design framework using several example designs and a comparison to a conventional co-design method that does not consider reliability. Our experimental evaluation demonstrates that the proposed framework can be used to study the tradeoffs between area, performance, and reliability and that it is important to include reliability as a first class parameter in optimization.
UR - https://www.scopus.com/pages/publications/60549085089
U2 - 10.1109/ISQED.2005.104
DO - 10.1109/ISQED.2005.104
M3 - Conference contribution
AN - SCOPUS:60549085089
SN - 0769523013
SN - 9780769523019
T3 - Proceedings - International Symposium on Quality Electronic Design, ISQED
SP - 375
EP - 380
BT - Proceedings - 6th International Symposium on Quality Electronic Design, ISQED 2005
T2 - 6th International Symposium on Quality Electronic Design, ISQED 2005
Y2 - 21 March 2005 through 23 March 2005
ER -