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Reliability-centric high-level synthesis

  • S. Tosun
  • , N. Mansouri
  • , E. Arvas
  • , M. Kandemir
  • , Yuan Xie
  • Syracuse University
  • Pennsylvania State University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

62 Citations (Scopus)

Abstract

Importance of addressing soft errors in both safety critical applications and commercial consumer products is increasing, mainly due to ever shrinking geometries, higher-density circuits, and employment of power-saving techniques such as voltage scaling and component shut-down. As a result, it is becoming necessary to treat reliability as a first-class citizen in system design. In particular, reliability decisions taken early in system design can have significant benefits in terms of design quality. Motivated by this observation, this paper presents a reliability-centric high-level synthesis approach that addresses the soft error problem. The proposed approach tries to maximize reliability of the design while observing the bounds on area and performance, and makes use of our reliability characterization of hardware components such as adders and multipliers. We implemented the proposed approach, performed experiments with several designs, and compared the results with those obtained by a prior proposal.

Original languageEnglish
Title of host publicationProceedings - Design, Automation and Test in Europe, DATE 2005
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1258-1263
Number of pages6
ISBN (Print)0769522882, 9780769522883
DOIs
Publication statusPublished - 2005
Externally publishedYes
Event2005 Design, Automation and Test in Europe, DATE 2005 - Munich, Germany
Duration: 7 Mar 200511 Mar 2005

Publication series

NameProceedings -Design, Automation and Test in Europe, DATE '05
VolumeII
ISSN (Print)1530-1591

Conference

Conference2005 Design, Automation and Test in Europe, DATE 2005
Country/TerritoryGermany
CityMunich
Period7/03/0511/03/05

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