TY - GEN
T1 - Kriging ve rassal alan öncülü ile sentetik toplam elektron i̇çeriǧi aradeǧerlemesi
AU - Sayin, Işiltan
AU - Arikan, Feza
AU - Arikan, Orhan
PY - 2007
Y1 - 2007
N2 - Total Electron Content (TEC) can be used for analyzing the variability of the ionosphere in space and time. In this study, spatial interpolation is implemented by Kriging and Random Field Priors (RFP), which are widely used in geostatistics. Performance of Kriging and RFP methods are analyzed on synthetic TEC data for different trend functions, sampling patterns, sampling numbers, variance and range values of covariance function which is used to simulate the synthetic data, by comparing the normalized errors of interpolations. In regular sampling patterns, as opposed to random sampling, the normalized average error is very close to each other for all methods and trend assumptions. The error increases with variance and decreases with range. As the number of samples increase, the normalized error also decreases.
AB - Total Electron Content (TEC) can be used for analyzing the variability of the ionosphere in space and time. In this study, spatial interpolation is implemented by Kriging and Random Field Priors (RFP), which are widely used in geostatistics. Performance of Kriging and RFP methods are analyzed on synthetic TEC data for different trend functions, sampling patterns, sampling numbers, variance and range values of covariance function which is used to simulate the synthetic data, by comparing the normalized errors of interpolations. In regular sampling patterns, as opposed to random sampling, the normalized average error is very close to each other for all methods and trend assumptions. The error increases with variance and decreases with range. As the number of samples increase, the normalized error also decreases.
UR - https://www.scopus.com/pages/publications/50249174014
U2 - 10.1109/SIU.2007.4298671
DO - 10.1109/SIU.2007.4298671
M3 - Konferans katkısı
AN - SCOPUS:50249174014
SN - 1424407192
SN - 9781424407194
T3 - 2007 IEEE 15th Signal Processing and Communications Applications, SIU
BT - 2007 IEEE 15th Signal Processing and Communications Applications, SIU
T2 - 2007 IEEE 15th Signal Processing and Communications Applications, SIU
Y2 - 11 June 2007 through 13 June 2007
ER -