Growth and experimental evidences for doped nanofilms by X-ray photoemission spectroscopy data analyses

A. Hamodi; Tuncer Hökelek; Natheer B. Mahmood; Y. I. Hamodi; T. Bdair; A. T. Salih; K. K. Naji

doi:10.1088/1742-6596/1804/1/012085

Growth and experimental evidences for doped nanofilms by X-ray photoemission spectroscopy data analyses

A. Hamodi
, Tuncer Hökelek
, Natheer B. Mahmood
, Y. I. Hamodi
, T. Bdair
, A. T. Salih
, K. K. Naji

Hacettepe University

Research output: Contribution to journal › Conference article › peer-review

2 Citations (Scopus)

Abstract

By using the molecular beam epitaxy growth technique, the impacts of growth temperatures for Bi2Te3 thin films were investigated, besides of the substrate temperatures on growth. Moreover, the full width half maximums, based on the X-ray photoemission spectroscopy measurements, have been shown clear results for Cr-Te bonds in chromium doped Bi2Te3 thin films. The current aim is a spotlight on enlightening how chromium is joined within Bi2Te3 epitaxial thin films in the process of doping concentration by providing detailed experimental evidences through the systematic structure and electronic investigations of the compound.

Original language	English
Article number	012085
Journal	Journal of Physics: Conference Series
Volume	1804
Issue number	1
DOIs	https://doi.org/10.1088/1742-6596/1804/1/012085
Publication status	Published - 2 Mar 2021
Event	2nd International Conference of Modern Applications on Information and Communication Technology, ICMAICT 2020 - Babylon-Hilla City, Iraq Duration: 22 Oct 2020 → 23 Oct 2020

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@article{b46fcad1cffa48679273cd89060eb473,

title = "Growth and experimental evidences for doped nanofilms by X-ray photoemission spectroscopy data analyses",

abstract = "By using the molecular beam epitaxy growth technique, the impacts of growth temperatures for Bi2Te3 thin films were investigated, besides of the substrate temperatures on growth. Moreover, the full width half maximums, based on the X-ray photoemission spectroscopy measurements, have been shown clear results for Cr-Te bonds in chromium doped Bi2Te3 thin films. The current aim is a spotlight on enlightening how chromium is joined within Bi2Te3 epitaxial thin films in the process of doping concentration by providing detailed experimental evidences through the systematic structure and electronic investigations of the compound.",

author = "A. Hamodi and Tuncer H{\"o}kelek and Mahmood, \{Natheer B.\} and Hamodi, \{Y. I.\} and T. Bdair and Salih, \{A. T.\} and Naji, \{K. K.\}",

note = "Publisher Copyright: {\textcopyright} Published under licence by IOP Publishing Ltd.; 2nd International Conference of Modern Applications on Information and Communication Technology, ICMAICT 2020 ; Conference date: 22-10-2020 Through 23-10-2020",

year = "2021",

month = mar,

day = "2",

doi = "10.1088/1742-6596/1804/1/012085",

language = "English",

volume = "1804",

journal = "Journal of Physics: Conference Series",

issn = "1742-6588",

publisher = "IOP Publishing Ltd.",

number = "1",

}

TY - JOUR

T1 - Growth and experimental evidences for doped nanofilms by X-ray photoemission spectroscopy data analyses

AU - Hamodi, A.

AU - Hökelek, Tuncer

AU - Mahmood, Natheer B.

AU - Hamodi, Y. I.

AU - Bdair, T.

AU - Salih, A. T.

AU - Naji, K. K.

N1 - Publisher Copyright: © Published under licence by IOP Publishing Ltd.

PY - 2021/3/2

Y1 - 2021/3/2

N2 - By using the molecular beam epitaxy growth technique, the impacts of growth temperatures for Bi2Te3 thin films were investigated, besides of the substrate temperatures on growth. Moreover, the full width half maximums, based on the X-ray photoemission spectroscopy measurements, have been shown clear results for Cr-Te bonds in chromium doped Bi2Te3 thin films. The current aim is a spotlight on enlightening how chromium is joined within Bi2Te3 epitaxial thin films in the process of doping concentration by providing detailed experimental evidences through the systematic structure and electronic investigations of the compound.

AB - By using the molecular beam epitaxy growth technique, the impacts of growth temperatures for Bi2Te3 thin films were investigated, besides of the substrate temperatures on growth. Moreover, the full width half maximums, based on the X-ray photoemission spectroscopy measurements, have been shown clear results for Cr-Te bonds in chromium doped Bi2Te3 thin films. The current aim is a spotlight on enlightening how chromium is joined within Bi2Te3 epitaxial thin films in the process of doping concentration by providing detailed experimental evidences through the systematic structure and electronic investigations of the compound.

UR - https://www.scopus.com/pages/publications/85102351145

U2 - 10.1088/1742-6596/1804/1/012085

DO - 10.1088/1742-6596/1804/1/012085

M3 - Conference article

AN - SCOPUS:85102351145

SN - 1742-6588

VL - 1804

JO - Journal of Physics: Conference Series

JF - Journal of Physics: Conference Series

IS - 1

M1 - 012085

T2 - 2nd International Conference of Modern Applications on Information and Communication Technology, ICMAICT 2020

Y2 - 22 October 2020 through 23 October 2020

ER -

Growth and experimental evidences for doped nanofilms by X-ray photoemission spectroscopy data analyses

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