Deep Learning Approach for EEG Artifact Identification and Classification

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

7 Citations (Scopus)

Abstract

Electroencephalography (EEG) signals are normally susceptible to various artifacts and noises from different sources. In this paper, firstly the existence of artifacts will be identified on the recorded EEG signals and then the origin of the detected artifact will be determined among 7 different sources. Due to the nature of EEG signals, almost no specialist can determine artifact source through eye inspection. This paper introduces the utilization of 1-D Convolutional Neural Network (CNN) in multi-class EEG artifact classification. Proposed CNN models were kept as simple as possible to have the best operation time but in the meantime, models were selected adequately deep to extract appropriate artifact features from applied EEG signals. Obtained results prove that proposed architectures are able to classify artifacts with high accuracy.

Original languageEnglish
Title of host publicationProceedings - 6th International Conference on Computer Science and Engineering, UBMK 2021
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages320-325
Number of pages6
ISBN (Electronic)9781665429085
DOIs
Publication statusPublished - 2021
Event6th International Conference on Computer Science and Engineering, UBMK 2021 - Ankara, Turkey
Duration: 15 Sept 202117 Sept 2021

Publication series

NameProceedings - 6th International Conference on Computer Science and Engineering, UBMK 2021

Conference

Conference6th International Conference on Computer Science and Engineering, UBMK 2021
Country/TerritoryTurkey
CityAnkara
Period15/09/2117/09/21

Keywords

  • Artifact Classification
  • Automated Feature Extraction
  • Convolutional Neural Network (CNN)
  • Deep Learning
  • Electroencephalography (EEG)

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